JPH0259477U - - Google Patents
Info
- Publication number
- JPH0259477U JPH0259477U JP13770888U JP13770888U JPH0259477U JP H0259477 U JPH0259477 U JP H0259477U JP 13770888 U JP13770888 U JP 13770888U JP 13770888 U JP13770888 U JP 13770888U JP H0259477 U JPH0259477 U JP H0259477U
- Authority
- JP
- Japan
- Prior art keywords
- clocks
- clock
- synchronization
- taken out
- measuring units
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13770888U JPH0259477U (en]) | 1988-10-21 | 1988-10-21 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13770888U JPH0259477U (en]) | 1988-10-21 | 1988-10-21 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0259477U true JPH0259477U (en]) | 1990-05-01 |
Family
ID=31399378
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13770888U Pending JPH0259477U (en]) | 1988-10-21 | 1988-10-21 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0259477U (en]) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57114867A (en) * | 1981-01-08 | 1982-07-16 | Nec Corp | Tester for logic circuit |
JPS5911423A (ja) * | 1982-07-13 | 1984-01-21 | Fujitsu Ltd | システムクロツク制御方式 |
-
1988
- 1988-10-21 JP JP13770888U patent/JPH0259477U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57114867A (en) * | 1981-01-08 | 1982-07-16 | Nec Corp | Tester for logic circuit |
JPS5911423A (ja) * | 1982-07-13 | 1984-01-21 | Fujitsu Ltd | システムクロツク制御方式 |
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